Invention Grant
- Patent Title: Sampling circuit and sampling method
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Application No.: US17341941Application Date: 2021-06-08
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Publication No.: US11611341B2Publication Date: 2023-03-21
- Inventor: Peter Bogner , Herwig Wappis
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater Matsil, LLP
- Priority: DE102018131711.5 20181211
- Main IPC: H03K17/687
- IPC: H03K17/687 ; H03F3/45
Abstract:
Sampling circuits and methods for sampling are provided. In a first operating phase, sampling capacitors are coupled to inputs, and in a second operating phase, to a common-mode signal.
Public/Granted literature
- US20210297077A1 Sampling Circuit and Sampling Method Public/Granted day:2021-09-23
Information query
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