Invention Grant
- Patent Title: Zoned memory device recovery after a key-value store failure
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Application No.: US17314657Application Date: 2021-05-07
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Publication No.: US11614870B2Publication Date: 2023-03-28
- Inventor: Pierre Labat , Nabeel Meeramohideen Mohamed , Steven Moyer
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
A system includes a zoned memory device allocating a zone storing a block belonging to a key-value set, and a processing device, operatively coupled with the zoned memory device, to perform operations including obtaining zone status information associated with the zone, identifying that the zone is a non-filled zone in view of the zone status information, and recovering the non-filled zone to obtain a recovered zone.
Public/Granted literature
- US20220357859A1 ZONED MEMORY DEVICE RECOVERY AFTER A KEY-VALUE STORE FAILURE Public/Granted day:2022-11-10
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