Invention Grant
- Patent Title: Integrated circuit with capability of inhibiting ESD zap
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Application No.: US17481341Application Date: 2021-09-22
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Publication No.: US11616360B2Publication Date: 2023-03-28
- Inventor: Chih-Wei Lai , Yun-Jen Ting , Yi-Han Wu , Kun-Hsin Lin , Hsin-Kun Hsu
- Applicant: eMemory Technology Inc.
- Applicant Address: TW Hsin-Chu
- Assignee: eMemory Technology Inc.
- Current Assignee: eMemory Technology Inc.
- Current Assignee Address: TW Hsin-Chu
- Agency: WPAT, PC
- Main IPC: H02H9/04
- IPC: H02H9/04 ; H01L27/02

Abstract:
An integrated circuit is provided. An ESD inhibition circuit of the integrated circuit is connected with a first pad, a first node and a second node. The ESD inhibition circuit includes a capacitor bank, a resistor, a voltage selector and a switching transistor. The capacitor bank is connected between the first pad and a third node. The resistor is connected between the third node and the first node. The two input terminals of the voltage selector are connected with the third node and a fourth node, respectively. An output terminal of the voltage selector is connected with a fifth node. A first terminal of the switching transistor is connected with the first pad. A second terminal of the switching transistor is connected with the second node. A gate terminal of the switching transistor is connected with the fifth node.
Public/Granted literature
- US20220158446A1 INTEGRATED CIRCUIT WITH CAPABILITY OF INHIBITING ESD ZAP Public/Granted day:2022-05-19
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