Invention Grant
- Patent Title: Retroreflectometer for non-contact measurements of optical characteristics
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Application No.: US17369852Application Date: 2021-07-07
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Publication No.: US11619582B2Publication Date: 2023-04-04
- Inventor: Eric John Nelson , Victor Fedoriouk
- Applicant: GAMMA SCIENTIFIC INC.
- Applicant Address: US CA San Diego
- Assignee: GAMMA SCIENTIFIC INC.
- Current Assignee: GAMMA SCIENTIFIC INC.
- Current Assignee Address: US CA San Diego
- Agency: Lewis Roca Rothgerber Christie LLP
- Main IPC: G01N21/55
- IPC: G01N21/55

Abstract:
A retroreflectometer for non-contact measurements of optical characteristics of retroreflective materials from a range of distances includes a light source for emitting a light beam; a first moving mirror assembly for scanning the light beam; a collimating lens for collimating the scanning light on an illumination spot on the surface of the DUT; an imaging lens for receiving a reflected scanning light comprised of the collimated scanning light reflected from the surface of the DUT; a second moving mirror assembly for controlling a predetermined observation angle, wherein the first moving mirror assembly and the second moving mirror assembly moved in synchronization to maintain concentricity of the illumination spot on the surface of the DUT; a light collector for collecting the reflected light from the second moving mirror assembly; a processor including a memory for determining the optical characteristics of the surface of the DUT responsive to the collected reflected light.
Public/Granted literature
- US20220011226A1 RETROREFLECTOMETER FOR NON-CONTACT MEASUREMENTS OF OPTICAL CHARACTERISTICS Public/Granted day:2022-01-13
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