Invention Grant
- Patent Title: Automated analyzer
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Application No.: US16646465Application Date: 2018-08-23
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Publication No.: US11619639B2Publication Date: 2023-04-04
- Inventor: Akihiro Yasui , Tatsuya Fukugaki , Masashi Akutsu , Naoto Suzuki
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JPJP2017-198333 20171012
- International Application: PCT/JP2018/031123 WO 20180823
- International Announcement: WO2019/073700 WO 20190418
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N35/02 ; G01N35/04 ; G01N35/10

Abstract:
The present invention reduces the turnaround time of an automated analyzer. During a period when cyclic measurement by a measurement unit is unnecessary, a controller washes a reaction vessel using a washing cycle having a cycle time shorter than that of an analysis cycle. A single analysis cycle and a single washing cycle both include a reaction disc stopping period and rotation period. In the washing cycle, there is no time during the stopping period when a sample dispensing mechanism, reagent dispensing mechanism, or stirring mechanism operates but there is a time when a washing mechanism operates. The washing cycle stopping period is shorter than the analysis cycle stopping period. The amount of rotation of the reaction disk in the analysis cycle rotation period is the same as the amount of rotation of the reaction disk in the washing cycle rotation period.
Public/Granted literature
- US20200292566A1 Automated Analyzer Public/Granted day:2020-09-17
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