Invention Grant
- Patent Title: Electrometry by optical charge conversion of defects in the solid-state
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Application No.: US16968471Application Date: 2019-02-13
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Publication No.: US11619660B2Publication Date: 2023-04-04
- Inventor: Gary Wolfowicz , Samuel James Whiteley , David Daniel Awschalom
- Applicant: The University of Chicago
- Applicant Address: US IL Chicago
- Assignee: The University of Chicago
- Current Assignee: The University of Chicago
- Current Assignee Address: US IL Chicago
- Agency: Crowell & Moring LLP
- International Application: PCT/US2019/017817 WO 20190213
- International Announcement: WO2019/168674 WO 20190906
- Main IPC: G01R15/24
- IPC: G01R15/24

Abstract:
Methods and systems are disclosed for sensing an environment electric field. In one exemplary implementation, a method includes disposing a sensor in the environment, wherein the sensor comprising a crystalline lattice and at least one optically-active defect in the crystalline lattice; pre-exciting the crystalline lattice to prepare at least one defect in a first charge state using a first optical beam at a first optical wavelength; converting at least one defect from the first charge state to a second charge state using a second optical beam at a second optical wavelength; monitoring a characteristics of photoluminescence emitted from the defect during or after the conversion of the at least one defect from the first charge state to the second charge state; and determining a characteristics of the electric field in the environment according to the monitored characteristics of the photoluminescence.
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