Invention Grant
- Patent Title: Enhanced loopback diagnostic systems and methods
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Application No.: US17195342Application Date: 2021-03-08
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Publication No.: US11619667B2Publication Date: 2023-04-04
- Inventor: Mei-Mei Su , Seth Craighead
- Applicant: Advantest Corporation
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: G01R31/317
- IPC: G01R31/317 ; G01R31/3185 ; G01R31/28 ; H04L1/24

Abstract:
Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a tester system diagnostic method includes forwarding test signals to a loopback component; receiving the test signals from the loopback component; and analyzing the test signals to diagnose whether or not the test system is experiencing problems associated with electrostatic discharges, including analysis of eye scan configuration data corresponding to characteristics of the test signals. In one exemplary implementation, analyzing the eye scan configuration data, including analyzing symmetry of a graphical representation (e.g., eye pattern, eye diagram, etc.) of the eye scan configuration data with respect to a horizontal graphical representation axis.
Public/Granted literature
- US20210302498A1 ENHANCED LOOPBACK DIAGNOSTIC SYSTEMS AND METHODS Public/Granted day:2021-09-30
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