Invention Grant
- Patent Title: Method for compensating for an influence of a magnetic interference source on a measurement of a magnetic field sensor in a device and a device
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Application No.: US17456120Application Date: 2021-11-22
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Publication No.: US11619683B2Publication Date: 2023-04-04
- Inventor: Rui Zhang , Sudhakaran Sreepad , Parambath Muhammad
- Applicant: Robert Bosch GmbH
- Applicant Address: DE Stuttgart
- Assignee: Robert Bosch GmbH
- Current Assignee: Robert Bosch GmbH
- Current Assignee Address: DE Stuttgart
- Agency: Norton Rose Fulbright US LLP
- Agent Gerard Messina
- Priority: DE102020215043.5 20201130
- Main IPC: G01R33/00
- IPC: G01R33/00 ; H04R1/10 ; G01R33/02

Abstract:
A method and device for compensating for an influence of a magnetic interference source on a measurement of a magnetic field sensor in a device. In the method, a magnetic flux density M1 measured with the magnetic field sensor at a measured ambient temperature Tk is compensated for with a compensation factor Minterference of the magnetic interference source according to M=M1−Minterference, where Minterference=M0+aM0(T′k−T0) and M0 is a magnetic reference flux density relative to a reference temperature T0, a corresponding to a material parameter, which is defined for a used magnet material of the magnetic interference source, and the measured ambient temperature Tk being corrected using a non-linear delay parameter to a temperature of the magnetic interference source T′k. The method is used for the axis-based compensation of a temperature drift, the material parameter a being determined individually for each Cartesian axis.
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