Method for compensating for an influence of a magnetic interference source on a measurement of a magnetic field sensor in a device and a device
Abstract:
A method and device for compensating for an influence of a magnetic interference source on a measurement of a magnetic field sensor in a device. In the method, a magnetic flux density M1 measured with the magnetic field sensor at a measured ambient temperature Tk is compensated for with a compensation factor Minterference of the magnetic interference source according to M=M1−Minterference, where Minterference=M0+aM0(T′k−T0) and M0 is a magnetic reference flux density relative to a reference temperature T0, a corresponding to a material parameter, which is defined for a used magnet material of the magnetic interference source, and the measured ambient temperature Tk being corrected using a non-linear delay parameter to a temperature of the magnetic interference source T′k. The method is used for the axis-based compensation of a temperature drift, the material parameter a being determined individually for each Cartesian axis.
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