Invention Grant
- Patent Title: Magnetic field measurement apparatus and magnetic field measurement method
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Application No.: US17192639Application Date: 2021-03-04
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Publication No.: US11619687B2Publication Date: 2023-04-04
- Inventor: Yoshiharu Yoshii , Norikazu Mizuochi
- Applicant: SUMIDA CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SUMIDA CORPORATION
- Current Assignee: SUMIDA CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Cowan, Liebowitz & Latman, P.C.
- Agent Mark Montague
- Priority: JPJP2018-126541 20180703
- Main IPC: G01R33/032
- IPC: G01R33/032

Abstract:
An ODMR member is arranged in a measurement target AC magnetic field. A coil applies a magnetic field of a microwave to the ODMR member. A high frequency power supply causes the coil to conduct a current of the microwave. An irradiating device irradiates the ODMR member with light. A light receiving device detects light that the ODMR member emits. A measurement control unit performs a predetermined DC magnetic field measurement sequence at a predetermined phase of the measurement target AC magnetic field, and in the DC magnetic field measurement sequence, controls the high frequency power supply and the irradiating device and thereby determines a detection light intensity of the light detected by the light receiving device. A magnetic field calculation unit calculates an intensity of the measurement target AC magnetic field on the basis of the predetermined phase and the detection light intensity.
Public/Granted literature
- US20210190883A1 MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT METHOD Public/Granted day:2021-06-24
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