Invention Grant
- Patent Title: Bias scoring of machine learning project data
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Application No.: US16704965Application Date: 2019-12-05
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Publication No.: US11620542B2Publication Date: 2023-04-04
- Inventor: Emily Dodwell , Balachander Krishnamurthy , Rajat Malik , Ritwik Mitra
- Applicant: AT&T Intellectual Property I, L.P.
- Applicant Address: US GA Atlanta
- Assignee: AT&T Intellectual Property I, L.P.
- Current Assignee: AT&T Intellectual Property I, L.P.
- Current Assignee Address: US GA Atlanta
- Agency: Guntin & Gust, PLC
- Agent John G. Rauch
- Main IPC: G06N5/04
- IPC: G06N5/04 ; G06F16/28 ; G06N20/00

Abstract:
Aspects of the subject disclosure may include, for example, system and apparatus that enable operations that may include receiving, by a processing system, project data defining a proposed machine learning (ML) project of an entity and storing the project data in a project database with other project data for other projects. The operations may further include extracting extracted features of the proposed project and, based on the extracted features, determining a clustering assignment for the proposed project. Determining the clustering assignment may comprise comparing information about the proposed project including the extracted features with information about the other projects and assigning the proposed project to a cluster including one or more projects having similar bias characteristics as the proposed project. The operations may further include determining a risk of potential bias for the proposed project and, based on the risk of bias, recommending a corrective action to reduce the risk of bias. Machine learning models may be used for project clustering and bias score determination and may be readily updated as new ML projects are evaluated. Other embodiments are disclosed.
Public/Granted literature
- US20210174222A1 BIAS SCORING OF MACHINE LEARNING PROJECT DATA Public/Granted day:2021-06-10
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