Invention Grant
- Patent Title: Image inspection device, image inspection method, and image inspection instructions
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Application No.: US17028041Application Date: 2020-09-22
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Publication No.: US11620744B2Publication Date: 2023-04-04
- Inventor: Yasumasa Tsukamoto
- Applicant: Konica Minolta, Inc.
- Applicant Address: JP Tokyo
- Assignee: Konica Minolta, Inc.
- Current Assignee: Konica Minolta, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Osha Bergman Watanabe & Burton LLP
- Priority: JPJP2019-189086 20191016
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T1/20 ; H04N1/00

Abstract:
An image inspection device inspects an inspection image obtained by reading a sheet. The image inspection device includes a hardware processor that: performs inspection by comparing the inspection image with a reference image that is obtained by reading the original image that is printed on the sheet; determines whether a possibility of abnormality exists in the reference image based on a difference between the reference image and the inspection image; displays a difference portion between the reference image and the inspection image when determining that the possibility of abnormality exists in the reference image; receives a selection of a normality or an abnormality for each of the reference image and the inspection image; and replaces the reference image with the inspection image when the abnormality is selected for the reference image and the normality is selected for the inspection image.
Public/Granted literature
- US20210118115A1 IMAGE INSPECTION DEVICE, IMAGE INSPECTION METHOD, AND IMAGE INSPECTION INSTRUCTIONS Public/Granted day:2021-04-22
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