Invention Grant
- Patent Title: Abnormality detection circuit
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Application No.: US17875793Application Date: 2022-07-28
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Publication No.: US11620926B2Publication Date: 2023-04-04
- Inventor: Akira Hashimoto , Takateru Yamamoto , Sukenori Ito , Yasunobu Inoue
- Applicant: Rohm Co., Ltd.
- Applicant Address: JP Kyoto
- Assignee: Rohm Co., Ltd.
- Current Assignee: Rohm Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Fish & Richardson P.C.
- Priority: JP2018-137846 20180723
- Main IPC: G09G3/36
- IPC: G09G3/36 ; G02F1/133 ; G09G3/00

Abstract:
An abnormality detection circuit includes: a plurality of voltage dividing circuits; a first selector configured to select and output one of a plurality of outputs of the plurality of voltage dividing circuits; a first comparator configured to compare an output of the first selector with a reference voltage; and a first detector configured to detect an abnormality based on an output of the first comparator, wherein the selection of the first selector is switched in synchronization with a vertical synchronization signal or a horizontal synchronization signal of a liquid crystal display device.
Public/Granted literature
- US20220366824A1 ABNORMALITY DETECTION CIRCUIT Public/Granted day:2022-11-17
Information query
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