Invention Grant
- Patent Title: Wafer-scale memory techniques
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Application No.: US17162796Application Date: 2021-01-29
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Publication No.: US11621257B2Publication Date: 2023-04-04
- Inventor: Brent Keeth , Bambi L. DeLaRosa , Eiichi Nakano
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G11C5/06
- IPC: G11C5/06 ; G06F3/06 ; H01L25/00 ; H01L25/18 ; H01L21/00 ; G11C29/00 ; H01L27/108

Abstract:
Techniques for wafer-scale memory device and systems are provided. In an example, a wafer-scale memory device can include a large single substrate, multiple memory circuit areas including dynamic random-access memory (DRAM), the multiple memory circuit areas integrated with the substrate and configured to form an array on the substrate, and multiple streets separating the memory circuit areas. The streets can accommodate attaching the substrate to a wafer-scale processor. In certain examples, the large, single substrate can have a major surface area of more than 20,000 square millimeters (mm2).
Public/Granted literature
- US20210240344A1 WAFER-SCALE MEMORY TECHNIQUES Public/Granted day:2021-08-05
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