Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
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Application No.: US16820273Application Date: 2020-03-16
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Publication No.: US11621341B2Publication Date: 2023-04-04
- Inventor: Shing-Yih Shih
- Applicant: NANYA TECHNOLOGY CORPORATION
- Applicant Address: TW New Taipei
- Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee Address: TW New Taipei
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/8238 ; H01L21/762 ; H01L29/423 ; H01L29/78 ; H01L29/49

Abstract:
The present application discloses a semiconductor device and a method for fabricating the semiconductor device. The semiconductor device includes a substrate including a first region, and a first transistor positioned in the first region. The first transistor includes a first bottom gate structure positioned on the substrate, a first channel layer positioned on the first bottom gate structure, a first top gate structure positioned on the first channel layer, and two first source/drain regions positioned on two sides of the first channel layer.
Public/Granted literature
- US20210288160A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2021-09-16
Information query
IPC分类: