Invention Grant
- Patent Title: Test device and a test method
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Application No.: US17159712Application Date: 2021-01-27
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Publication No.: US11624765B2Publication Date: 2023-04-11
- Inventor: Tomohiko Maruo , Hiroyuki Baba , Masafumi Setsu
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Atsugi
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Atsugi
- Agency: Greer Burns & Crain Ltd.
- Priority: JPJP2020-019003 20200206,JPJP2020-019004 20200206
- Main IPC: G01R29/10
- IPC: G01R29/10 ; G01R29/08 ; H04B17/00 ; H01Q3/16

Abstract:
A test device 1 that measures the transmission properties or reception properties of the test object 100 having the test antenna 110, and includes an anechoic box 50, a plurality of test antennas 6 that transmit or receive radio signals to or from the antenna, under tests, a posture changeable mechanism 56 that changes the posture of the test object arranged in the quiet zone QZ, a measurement device 2 that measures the transmission properties or reception properties of the test object with respect to the test object whose posture is changed by the posture changeable mechanism using the test antenna, and the reflector 7 that radio signal is reflected. The plurality of test antennas include a reflection type test antenna 6a and the plurality of direct-type test antennas 6b, 6c, 6d.
Public/Granted literature
- US20210247431A1 TEST DEVICE AND A TEST METHOD Public/Granted day:2021-08-12
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