Invention Grant
- Patent Title: Core partition circuit and testing device
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Application No.: US17085019Application Date: 2020-10-30
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Publication No.: US11624782B2Publication Date: 2023-04-11
- Inventor: Yunhao Xing , Huafeng Xiao , Peng Wang
- Applicant: Shanghai Zhaoxin Semiconductor Co., Ltd.
- Applicant Address: CN Shanghai
- Assignee: Shanghai Zhaoxin Semiconductor Co., Ltd.
- Current Assignee: Shanghai Zhaoxin Semiconductor Co., Ltd.
- Current Assignee Address: CN Shanghai
- Agency: McClure, Qualey & Rodack, LLP
- Priority: CN202011046827.8 20200929
- Main IPC: G01R31/3177
- IPC: G01R31/3177 ; G01R31/317 ; H03K19/20 ; G01R31/3185 ; G01R31/3183 ; G01R31/28

Abstract:
A core partition circuit comprises a first decompression circuit, a second decompression circuit, a first switching circuit, an wrapper scanning circuit, a first compression circuit, a second compression circuit and a second switching circuit. The first and second decompression circuits decompress an input signal. The first switching circuit outputs the output signal of the first decompression circuit or the second decompression circuit according to a first control signal. The wrapper scanning circuit receives the output signal of the first decompression circuit or the second decompression circuit to scan the internal or the port of the core partition circuit. The first and second compression circuits respectively compress the internal logic and the port logic of the core partition circuit. The second switching circuit outputs the compressed internal logic or port logic of the core partition circuit according to the first control signal.
Public/Granted literature
- US20220099735A1 CORE PARTITION CIRCUIT AND TESTING DEVICE Public/Granted day:2022-03-31
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