Invention Grant
- Patent Title: Fault detection
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Application No.: US17199279Application Date: 2021-03-11
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Publication No.: US11625504B2Publication Date: 2023-04-11
- Inventor: Yanis Linge , Simon Landry
- Applicant: STMICROELECTRONICS (ROUSSET) SAS
- Applicant Address: FR Rousset
- Assignee: STMICROELECTRONICS (ROUSSET) SAS
- Current Assignee: STMICROELECTRONICS (ROUSSET) SAS
- Current Assignee Address: FR Rousset
- Agency: Seed Intellectual Property Law Group LLP
- Priority: FR2002563 20200316
- Main IPC: G06F21/72
- IPC: G06F21/72

Abstract:
The present disclosure relates to a method of fault detection in an application, by an electronic circuit, of a first function to a message, including the steps of generating, from the message, a non-zero even number N of different first sets, each including P shares; applying, to the P shares of each first set, one or a plurality of second functions delivering, for each first set, a second set including Q images; and cumulating all the images, starting with at most Q-1 images selected from among the Q images of a same second set.
Public/Granted literature
- US20210286902A1 FAULT DETECTION Public/Granted day:2021-09-16
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