Invention Grant
- Patent Title: Metal connections and routing for advanced 3D layout designs
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Application No.: US17115122Application Date: 2020-12-08
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Publication No.: US11626329B2Publication Date: 2023-04-11
- Inventor: H. Jim Fulford , Mark I. Gardner
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: H01L21/8238
- IPC: H01L21/8238 ; H01L27/092 ; H01L29/78 ; H01L29/66 ; H01L21/768 ; H01L23/535

Abstract:
A semiconductor device can include a pad layer including at least one pad structure having a core area surrounded by a peripheral area, and a transistor over the core area. The transistor includes a channel structure extending vertically and a gate structure all around a sidewall portion of the channel structure. The channel structure has a source region and a drain region on opposing ends of a vertical channel region. The channel structure is configured to be electrically coupled to the pad structure. The semiconductor device can further include a first vertical interconnect structure that contacts a top surface of the channel structure, a second vertical interconnect structure that contacts the peripheral area and is configured to be coupled to a bottom surface of the channel structure via the pad structure, and a third vertical interconnect structure that is positioned away from the channel structure and contacts the gate structure.
Public/Granted literature
- US20210366787A1 METAL CONNECTIONS AND ROUTING FOR ADVANCED 3D LAYOUT DESIGNS Public/Granted day:2021-11-25
Information query
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