Invention Grant
- Patent Title: Systems and methods for data deduplication by generating similarity metrics using sketch computation
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Application No.: US17162687Application Date: 2021-01-29
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Publication No.: US11627207B2Publication Date: 2023-04-11
- Inventor: Santhosh Rahul Ponnala , Tarang Vaish
- Applicant: Ndata, Inc.
- Applicant Address: US CA Mountain View
- Assignee: Ndata, Inc.
- Current Assignee: Ndata, Inc.
- Current Assignee Address: US CA Mountain View
- Agency: Wilson Sonsini Goodrich & Rosati
- Main IPC: H04L69/04
- IPC: H04L69/04 ; G06F16/174

Abstract:
A method for data reduction may comprise computing (i) a first sketch of a first segment and (ii) a second sketch of a second segment. The first sketch and the second sketch may each comprise a set of features that are representative of or unique to the corresponding first and second segments. The method also comprise processing the first sketch and the second sketch to generate a similarity metric indicative of whether the second segment is similar to the first segment. The method may further comprise (1) performing a differencing operation on the second segment relative to the first segment when the similarity metric is greater than or equal to a similarity threshold, or (2) storing the first segment and the second segment in a database without performing the differencing operation when the similarity metric is less than the similarity threshold.
Public/Granted literature
- US20210360088A1 SYSTEMS AND METHODS FOR DATA DEDUPLICATION BY GENERATING SIMILARITY METRICS USING SKETCH COMPUTATION Public/Granted day:2021-11-18
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