Invention Grant
- Patent Title: Measurement program selection assisting apparatus and measurement control apparatus
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Application No.: US16655455Application Date: 2019-10-17
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Publication No.: US11630436B2Publication Date: 2023-04-18
- Inventor: Shinsaku Abe , Kuniyuki Nuka
- Applicant: Mitutoyo Corporation
- Applicant Address: JP Kanagawa
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Rankin, Hill & Clark LLP
- Priority: JPJP2018-198296 20181022,JPJP2019-098436 20190527
- Main IPC: G05B19/4069
- IPC: G05B19/4069 ; G06T19/00 ; G06T7/00 ; G06T7/73 ; G06T7/579 ; G06F3/04817 ; G06F30/20 ; G06V10/20 ; G06V20/20 ; G06V20/64

Abstract:
The present invention provides a measurement program selection assisting apparatus capable of visually confirming whether a selected measurement program is suitable for an object to be measured. One aspect of the present invention is a measurement program selection assisting apparatus comprising: a measurement program database storing a measurement program related to measurement of an object and superimposed display information corresponding to a three-dimensional shape of the object in association with each other; a display unit capable of displaying information defined in a virtual space superimposed on the real space; and a display control unit for acquiring the superimposed display information corresponding to a selected measurement program from the measurement program database and displaying the acquired superimposed display information in a mixed reality on the display unit.
Information query
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