• Patent Title: Analysis device, analysis method, and non-transitory computer readable storage medium
  • Application No.: US17269256
    Application Date: 2020-02-18
  • Publication No.: US11630451B2
    Publication Date: 2023-04-18
  • Inventor: Reiko HattoriYuya Ota
  • Applicant: OMRON Corporation
  • Applicant Address: JP Kyoto
  • Assignee: OMRON Corporation
  • Current Assignee: OMRON Corporation
  • Current Assignee Address: JP Kyoto
  • Agency: JCIPRNET
  • Priority: JPJP2019-045743 20190313
  • International Application: PCT/JP2020/006264 WO 20200218
  • International Announcement: WO2020/184087 WO 20200917
  • Main IPC: G06N5/046
  • IPC: G06N5/046 G05B23/02
Analysis device, analysis method, and non-transitory computer readable storage medium
Abstract:
An analysis device according to an aspect of the present disclosure: acquires a plurality of pieces of premise information and measurement data which relate to states of a plurality of mechanisms which configure a production line; identifies causal relationships among the plurality of mechanisms by statistically analyzing the plurality of pieces of measurement data under constraint conditions imposed by the premise information; outputs causal relationship information indicating the identified causal relationships; accepts a revision to the causal relationships indicated by the outputted causal relationship information; revises the premise information so as to impose the constraint conditions which comport with the revised causal relationships; and saves the revised premise information.
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