Invention Grant
- Patent Title: Apparatus and method for detecting reflection
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Application No.: US16998562Application Date: 2020-08-20
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Publication No.: US11631180B2Publication Date: 2023-04-18
- Inventor: Dongwoo Kang , Dong Kyung Nam , Jingu Heo
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2017-0177131 20171221
- Main IPC: G06T7/11
- IPC: G06T7/11 ; G06V10/141 ; G06V40/18 ; G06F3/01 ; G06T5/50 ; G06V10/143 ; G06V10/62 ; G06V20/59

Abstract:
A method and apparatus for detecting a reflection are provided. The method includes acquiring an input image of an object, based on an activation of an infrared light source, acquiring a reference image of the object, based on a deactivation of the infrared light source, and extracting a reflection region from the input image, based on the input image and the reference image.
Public/Granted literature
- US20200380691A1 APPARATUS AND METHOD FOR DETECTING REFLECTION Public/Granted day:2020-12-03
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