Invention Grant
- Patent Title: Feature inspection system
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Application No.: US17024792Application Date: 2020-09-18
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Publication No.: US11631184B2Publication Date: 2023-04-18
- Inventor: Mark Davis Haynes , Glen Paul Cork , Bharath Achyutha Rao , John Thomas Baumfalk-Lee , Matthew W. McKenna , Bruce E. Gabel , Scott Bishop , Gregorio Balandran
- Applicant: SPIRIT AEROSYSTEMS, INC.
- Applicant Address: US KS Wichita
- Assignee: SPIRIT AEROSYSTEMS, INC.
- Current Assignee: SPIRIT AEROSYSTEMS, INC.
- Current Assignee Address: US KS Wichita
- Agency: Hovey Williams LLP
- Main IPC: G06T7/246
- IPC: G06T7/246 ; G01N21/88 ; B64F5/40 ; B64F5/60

Abstract:
A system for inspecting features of an airframe, the system including a feature inspection device configured to measure an aspect of a first feature and a tracking subsystem configured to determine a position of the feature inspection device when the feature inspection device measures the aspect of the first feature. The system is configured to determine a position of the first feature on the airframe via the feature inspection device and the tracking subsystem, the determination of the position of the first feature being independent from the measurement of the aspect of the first feature.
Public/Granted literature
- US20220092793A1 FEATURE INSPECTION SYSTEM Public/Granted day:2022-03-24
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