Invention Grant
- Patent Title: Methods of yield assessment with crop photometry
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Application No.: US17581558Application Date: 2022-01-21
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Publication No.: US11631244B2Publication Date: 2023-04-18
- Inventor: Chad Clifford Berghoefer , Travis Allen Hanselman , Neil J Hausmann , Carlos Messina
- Applicant: PIONEER HI-BRED INTERNATIONAL, INC.
- Applicant Address: US IA Johnston
- Assignee: PIONEER HI-BRED INTERNATIONAL, INC.
- Current Assignee: PIONEER HI-BRED INTERNATIONAL, INC.
- Current Assignee Address: US IA Johnston
- Main IPC: G06V20/17
- IPC: G06V20/17 ; G06V20/10 ; G06T7/00 ; G06T7/194 ; G06T5/30 ; G06V20/20 ; H04N23/63 ; G06V20/68

Abstract:
A method of evaluating one or more kernels of an ear of maize using digital imagery that includes acquiring a digital image of the one or more kernels of the ear of maize without the use of spatial reference points, processing the digital image to estimate at least one physical property of the one or more kernels of the ear of maize from the digital image, and evaluating the at least one kernel of maize using the estimate of the at least one physical property of the at least one kernel of maize. The method includes using one or more such digital images to estimate yield on a plant, management zone, field, county and country level.
Public/Granted literature
- US20220148151A1 METHODS OF YIELD ASSESSMENT WITH CROP PHOTOMETRY Public/Granted day:2022-05-12
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