Invention Grant
- Patent Title: Sequential write and sequential write verify in memory device
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Application No.: US17328744Application Date: 2021-05-24
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Publication No.: US11631460B2Publication Date: 2023-04-18
- Inventor: Koji Sakui
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/34 ; G11C11/56 ; G11C16/10 ; G11C16/30

Abstract:
Some embodiments include apparatuses and methods for performing a first stage of an operation of storing information in a first memory cell and a second memory cell, and performing a second stage of the operation after the first stage to determine whether each of the first and second memory cells reaches a target state. The first memory cell is included in a first memory cell string coupled to a data line through a first select transistor. The second memory cell is included in a second memory cell string coupled to the data line through a second select transistor.
Public/Granted literature
- US20210280253A1 SEQUENTIAL WRITE AND SEQUENTIAL WRITE VERIFY IN MEMORY DEVICE Public/Granted day:2021-09-09
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