Invention Grant
- Patent Title: Bonding interposer and integrated circuit chip, and ultrasound probe using the same
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Application No.: US16038348Application Date: 2018-07-18
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Publication No.: US11631798B2Publication Date: 2023-04-18
- Inventor: Kyung-moo Choi , Dong Won Shin
- Applicant: SAMSUNG ELECTRONICS CO., LTD. , Dong Won Shin
- Applicant Address: KR Suwon-si; KR Incheon
- Assignee: SAMSUNG ELECTRONICS CO., LTD.,Dong Won Shin
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.,Dong Won Shin
- Current Assignee Address: KR Suwon-si; KR Incheon
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2017-0091052 20170718
- Main IPC: H01L41/047
- IPC: H01L41/047 ; G01S7/52 ; G01S15/89 ; A61B8/00 ; B06B1/06 ; G01N29/24 ; H01L21/48 ; H01L23/538 ; H01L23/00 ; H01L25/16 ; H01L41/09 ; H01L41/25

Abstract:
The method of bonding an interposer and an integrated circuit chip includes preparing an interposer including an insulator and conductive lines each having one end exposed to a first surface of the insulator and another end exposed to a second surface opposite to the first surface; placing a bonding mask on the interposer; forming through-holes on the bonding mask before or after the placing of the bonding mask on the interposer; filling the plurality with a conductive material; and bonding an integrated circuit chip to the bonding mask.
Public/Granted literature
- US20190027675A1 BONDING INTERPOSER AND INTEGRATED CIRCUIT CHIP, AND ULTRASOUND PROBE USING THE SAME Public/Granted day:2019-01-24
Information query
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