- Patent Title: Parameter estimation system, parameter estimation method, and parameter estimation program recording medium for estimating parameter and kernel functions by incorporating machine learning
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Application No.: US16753266Application Date: 2018-10-01
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Publication No.: US11636399B2Publication Date: 2023-04-25
- Inventor: Takafumi Kajihara , Keisuke Yamazaki
- Applicant: NEC CORPORATION , National Institute of Advanced Industrial Science and Technology
- Applicant Address: JP Tokyo; JP Tokyo
- Assignee: NEC CORPORATION,National Institute of Advanced Industrial Science and Technology
- Current Assignee: NEC CORPORATION,National Institute of Advanced Industrial Science and Technology
- Current Assignee Address: JP Tokyo; JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JPJP2017-193245 20171003
- International Application: PCT/JP2018/036731 WO 20181001
- International Announcement: WO2019/069865 WO 20190411
- Main IPC: G06N20/10
- IPC: G06N20/10 ; G06N7/00

Abstract:
A first sample acquisition unit acquires a parameter sample from a prior distribution. A function execution unit acquires data from a distribution by supplying the sample to a function. A degree-of-similarity calculation unit calculates the degree of similarity between the data and correct data using a kernel function. A kernel mean construction unit constructs a kernel mean of a posterior distribution from the degree of similarity, the sample, and the kernel function. A second sample acquisition unit acquires a new parameter sample from the kernel mean and the kernel function. A sample evaluation unit determines whether the difference between new data obtained by supplying one sample selected from the new samples to the function and the correct data is less than a prescribed threshold value. When it is determined that the difference is less than the prescribed threshold value, the sample evaluation unit estimates the selected sample as a parameter. The present invention enables estimation of a high-dimensional parameter of the function, thus making it possible to reduce calculation time.
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