An electrical stress protection circuit includes a detection circuit including a first transistor connected to a driving voltage rail and turned on when electrical stress is provided, and a bypass transistor turned on in response to a signal output when the first transistor is turned on and configured to provide electrical stress to a reference voltage rail. An electronic device configured to perform a predetermined function, includes a detection circuit including a first transistor connected to a driving voltage rail and turned on when electrical stress is provided, and an electrical stress protection circuit including a bypass transistor turned on in response to a signal output when the first transistor is turned on and configured to provide electrical stress to a reference voltage rail.