Invention Grant
- Patent Title: Offset calibration circuit and offset calibration method applied in signal processing circuit
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Application No.: US17228662Application Date: 2021-04-12
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Publication No.: US11637536B2Publication Date: 2023-04-25
- Inventor: Chun-Hao Lai , Chung-Lun Li
- Applicant: Realtek Semiconductor Corp.
- Applicant Address: TW HsinChu
- Assignee: Realtek Semiconductor Corp.
- Current Assignee: Realtek Semiconductor Corp.
- Current Assignee Address: TW HsinChu
- Agent Winston Hsu
- Priority: TW109134976 20201008
- Main IPC: H03F3/181
- IPC: H03F3/181 ; H03K3/013 ; H03F1/30
Abstract:
The present invention provides an offset calibration circuit used in a signal processing circuit, wherein the offset calibration circuit includes a supply voltage detection circuit and a calibration circuit. The supply voltage detection circuit is configured to detect a level of a supply voltage to generate a detection result, wherein the supply voltage is provided to an output stage in the signal processing circuit. The calibration circuit is configured to calculate a digital compensation value according to the detection result, wherein the digital compensation value is used for a digital processing circuit in the signal processing circuit to perform a DC offset calibration.
Public/Granted literature
- US20220115995A1 OFFSET CALIBRATION CIRCUIT AND OFFSET CALIBRATION METHOD APPLIED IN SIGNAL PROCESSING CIRCUIT Public/Granted day:2022-04-14
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