Invention Grant
- Patent Title: System, device and method for assessing a fit quality of an earpiece
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Application No.: US17444429Application Date: 2021-08-04
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Publication No.: US11638085B2Publication Date: 2023-04-25
- Inventor: Hami Monsarrat-Chanon , Jeremie Voix , Vincent Nadon , Thomas Habrant
- Applicant: ECOLE DE TECHNOLOGIE SUPERIEURE
- Applicant Address: CA Montreal
- Assignee: ECOLE DE TECHNOLOGIE SUPERIEURE
- Current Assignee: ECOLE DE TECHNOLOGIE SUPERIEURE
- Current Assignee Address: CA Montreal
- Agency: Brouillette Legal Inc.
- Agent Robert Brouillette
- Main IPC: H04R25/00
- IPC: H04R25/00 ; H04R1/10 ; H04R3/04

Abstract:
A system, device and method for assessing a fit quality of an earpiece while in use in a noisy environment. The earpiece having an external microphone for capturing an outer-ear audio signal and an internal microphone for capturing an inner-ear audio signal. The fit quality being assessed by estimating a filter according to the captured inner-ear and outer-ear audio signals, and determining a fit quality according to identified coefficients of the estimated filter. A system, device and method for assessing a seal quality of an earpiece while in use in a quiet environment. The earpiece having a loudspeaker for emitting a sound stimulus towards the ear canal and an internal microphone for capturing an audio signal inside the ear canal. The seal quality being assessed by estimating a transfer function according the emitted and captured sound stimulus, and determining at least one seal-quality indicator according to a signal magnitude of the transfer function.
Public/Granted literature
- US20210368258A1 SYSTEM, DEVICE AND METHOD FOR ASSESSING A FIT QUALITY OF AN EARPIECE Public/Granted day:2021-11-25
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