Invention Grant
- Patent Title: Apparatus for measuring levels of materials
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Application No.: US17310182Application Date: 2020-01-14
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Publication No.: US11639867B2Publication Date: 2023-05-02
- Inventor: Graham Barker , Carl Robert Tipton , Daniel James Whiting
- Applicant: JOHNSON MATTHEY PUBLIC LIMITED COMPANY
- Applicant Address: GB London
- Assignee: JOHNSON MATTHEY PUBLIC LIMITED COMPANY
- Current Assignee: JOHNSON MATTHEY PUBLIC LIMITED COMPANY
- Current Assignee Address: GB London
- Agency: BakerHostetler
- Priority: GB1903101 20190307
- International Application: PCT/GB2020/050064 WO 20200114
- International Announcement: WO2020/178544 WO 20200910
- Main IPC: G01F23/284
- IPC: G01F23/284 ; G01N33/28

Abstract:
An apparatus for determining the identity, location, or level of one or more material phases or the location of an interface between two material phases within a defined volume having, a linear array of units configured to generate and detect electromagnetic radiation; an elongate enclosure containing the array of units, being at least partially transparent to the electromagnetic radiation generated by the units; the apparatus being configured to be at least partially submerged within the one or more material phases within the defined volume, the linear array of units being configured to generate transmission signals through the at least partially transparent elongate enclosure to the one or more material phases surrounding the enclosure at locations along the length of the enclosure, and to receive return signals through the elongate enclosure at locations along the length of the enclosure from the one or more material phases surrounding the enclosure.
Public/Granted literature
- US20220082425A1 APPARATUS FOR MEASURING LEVELS OF MATERIALS Public/Granted day:2022-03-17
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