Invention Grant
- Patent Title: Structure evaluation system and structure evaluation method
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Application No.: US17500335Application Date: 2021-10-13
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Publication No.: US11639880B2Publication Date: 2023-05-02
- Inventor: Tomoki Shiotani , Katsufumi Hashimoto , Hidefumi Takamine , Kazuo Watabe
- Applicant: Kabushiki Kaisha Toshiba , Kyoto University
- Applicant Address: JP Tokyo; JP Kyoto
- Assignee: Kabushiki Kaisha Toshiba,Kyoto University
- Current Assignee: Kabushiki Kaisha Toshiba,Kyoto University
- Current Assignee Address: JP Tokyo; JP Kyoto
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: G01M5/00
- IPC: G01M5/00 ; G01N29/44 ; G01N29/14

Abstract:
According to one embodiment, a structure evaluation system according to an embodiment includes a plurality of sensors, a position locator, and an evaluator. The plurality of sensors detect elastic waves. The position locator locates positions of elastic wave sources by using the elastic waves among the plurality of elastic waves respectively detected by the plurality of sensors having an amplitude exceeding a threshold value determined according to positions of the sources of the plurality of elastic waves and the positions of the plurality of disposed sensors. The evaluator evaluates a deteriorated state of the structure on the basis of results of the position locating of the elastic wave sources which is performed by the position locator.
Public/Granted literature
- US20220034749A1 STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD Public/Granted day:2022-02-03
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