Invention Grant
- Patent Title: Inspection device, inspection method, and method for producing object to be inspected
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Application No.: US16607657Application Date: 2017-04-26
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Publication No.: US11639904B2Publication Date: 2023-05-02
- Inventor: Takeshi Ohbayashi , Masayuki Zaike , Takahiro Michimoto
- Applicant: NIKON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIKON CORPORATION
- Current Assignee: NIKON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- International Application: PCT/JP2017/016604 WO 20170426
- International Announcement: WO2018/198242 WO 20181101
- Main IPC: G01N23/046
- IPC: G01N23/046 ; G01N23/083

Abstract:
An inspection device includes a ray source that irradiates an object to be inspected with energy rays, a detection unit that detects energy rays that have passed through the object to be inspected, a displacement mechanism that sets a relative position of the object to be inspected and the ray source by displacing at least one of the object to be inspected and the ray source in relation to the other, an internal image generation unit that generates an internal image of the object to be inspected based on a detection amount distribution of the energy rays detected by the detection unit, and a control unit that controls the displacement mechanism based on the detection amount distribution of the energy rays detected by the detection unit.
Public/Granted literature
- US20200300784A1 INSPECTION DEVICE, INSPECTION METHOD, AND METHOD FOR PRODUCING OBJECT TO BE INSPECTED Public/Granted day:2020-09-24
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