- Patent Title: Method of detecting foreign object on stage and detection apparatus
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Application No.: US17116201Application Date: 2020-12-09
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Publication No.: US11639947B2Publication Date: 2023-05-02
- Inventor: Kenta Saiki , Takuya Ishida
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JPJP2020-002964 20200110
- Main IPC: G01R3/00
- IPC: G01R3/00 ; G01R31/28 ; G06T7/00 ; G01N21/95 ; G01N21/94 ; G06T7/73

Abstract:
A method of detecting a foreign object on a stage according to one aspect of the present disclosure includes acquiring first position information of a first pattern included in a first image in a reference state of a surface of the stage capable of attracting an object to be inspected; acquiring second position information of a second pattern included in a second image of the surface, the second image being obtained after obtaining the first image; and detecting one or more foreign objects on the surface by comparing the first position information and the second position information.
Public/Granted literature
- US20210215742A1 METHOD OF DETECTING FOREIGN OBJECT ON STAGE AND DETECTION APPARATUS Public/Granted day:2021-07-15
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