A measurement device is described that comprises a measurement unit configured to perform measurements on an electric signal of a device under test while applying at least one measurement parameter for performing the measurements. The measurement device has an integrated direct current source configured to power the device under test. The measurement device also comprises a monitoring unit configured to monitor at least one monitoring parameter of the direct current source. The measurement device has a control unit configured to control the measurement parameter. Further, a method for measuring a device under test is described.