Invention Grant
- Patent Title: Abnormality detection device
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Application No.: US17255518Application Date: 2018-06-28
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Publication No.: US11640459B2Publication Date: 2023-05-02
- Inventor: Takehiko Mizoguchi
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2018/024682 WO 20180628
- International Announcement: WO2020/003460 WO 20200102
- Main IPC: G06F21/55
- IPC: G06F21/55 ; G06F21/54 ; G06F21/56

Abstract:
A first anomaly detection unit detects anomalous first monitored data from among a plurality of first monitored data obtained from a monitored system. A second anomaly detection unit operates in parallel with the first anomaly detection unit and detects anomalous second monitored data from among a plurality of second monitored data obtained from the monitored system. In a first storage unit, the anomalous first monitored data and the anomalous second monitored data detected before lapse of a given time from detection time of the anomalous first monitored data are stored in association with each other. A first determination unit, when the anomalous first monitored data is detected, retrieves the anomalous second monitored data associated with the detected anomalous first monitored data from the first storage unit and outputs a first anomaly detection result including the retrieved anomalous second monitored data and the detected anomalous first monitored data.
Public/Granted literature
- US20210224383A1 ABNORMALITY DETECTION DEVICE Public/Granted day:2021-07-22
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