Invention Grant
- Patent Title: Method of forming a semiconductor structure including forming a buffer structure over a metal layer
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Application No.: US17643176Application Date: 2021-12-07
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Publication No.: US11640945B2Publication Date: 2023-05-02
- Inventor: Shing-Yih Shih
- Applicant: NANYA TECHNOLOGY CORPORATION
- Applicant Address: TW New Taipei
- Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee Address: TW New Taipei
- Agency: CKC & Partners Co., LLC
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/00 ; H01L21/768

Abstract:
A method of forming a semiconductor structure includes following steps. A first substrate and a second substrate are bonded together, in which the first substrate has a landing pad. The second substrate is etched to form an opening, in which the landing pad is exposed through the opening. A metal layer is formed over the landing pad and a sidewall of the second substrate that surrounds the opening. A buffer structure is formed over the metal layer. The buffer structure is etched such that a top surface of the buffer structure is below a top surface of the metal layer. A barrier structure is formed over metal layer and the buffer structure.
Public/Granted literature
- US20220102290A1 METHOD OF FORMING SEMICONDUCTOR STRUCTURE Public/Granted day:2022-03-31
Information query
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