Invention Grant
- Patent Title: Packaged die and RDL with bonding structures therebetween
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Application No.: US17244133Application Date: 2021-04-29
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Publication No.: US11640958B2Publication Date: 2023-05-02
- Inventor: Hsien-Wei Chen , Jie Chen
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L25/00
- IPC: H01L25/00 ; H01L23/00 ; H01L23/31 ; H01L21/56 ; H01L23/498 ; H01L21/48 ; H01L21/683 ; H01L25/065 ; H01L25/10 ; H01L25/18 ; H01L21/304

Abstract:
Embodiments of the present disclosure include semiconductor packages and methods of forming the same. An embodiment is a semiconductor package including a first package including one or more dies, and a redistribution layer coupled to the one or more dies at a first side of the first package with a first set of bonding joints. The redistribution layer including more than one metal layer disposed in more than one passivation layer, the first set of bonding joints being directly coupled to at least one of the one or more metal layers, and a first set of connectors coupled to a second side of the redistribution layer, the second side being opposite the first side.
Public/Granted literature
- US20210249399A1 PACKAGED DIE AND RDL WITH BONDING STRUCTURES THEREBETWEEN Public/Granted day:2021-08-12
Information query
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