Semiconductor device and method
Abstract:
In an embodiment, a device includes: a gate dielectric over a substrate; a gate electrode over the gate dielectric, the gate electrode including: a work function tuning layer over the gate dielectric; a glue layer over the work function tuning layer; a fill layer over the glue layer; and a void defined by inner surfaces of at least one of the fill layer, the glue layer, and the work function tuning layer, a material of the gate electrode at the inner surfaces including a work function tuning element.
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