Invention Grant
- Patent Title: Method and device for measuring characteristics of RF chains
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Application No.: US17633943Application Date: 2020-08-10
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Publication No.: US11641243B2Publication Date: 2023-05-02
- Inventor: Hojin Song , Seunghoon Lee
- Applicant: POSTECH RESEARCH AND BUSINESS DEVELOPMENT FOUNDATION
- Applicant Address: KR Pohang-si
- Assignee: POSTECH RESEARCH AND BUSINESS DEVELOPMENT FOUNDATION
- Current Assignee: POSTECH RESEARCH AND BUSINESS DEVELOPMENT FOUNDATION
- Current Assignee Address: KR Pohang-si
- Agency: Morgan, Lewis & Bockius LLP
- Priority: KR10-2019-0096947 20190808,KR10-2019-0157518 20191129
- International Application: PCT/KR2020/010576 WO 20200810
- International Announcement: WO2021/025545 WO 20210211
- Main IPC: H04B17/15
- IPC: H04B17/15 ; H04B17/11 ; H04B17/00

Abstract:
A measuring device may include: a signal generator for generating a test signal; and a measurement control unit that inputs the generated test signal to a radio frequency (RF) chain including at least one circuit element, detects output signals of a first diode, a second diode, and a third diode which receive, as input signals, signals generated on the basis of a coupled signal for an input test signal of a circuit element of the at least one circuit element and a coupled signal for an output test signal of the circuit element, and measures an S-parameter for the circuit element on the basis of a component signal of the third frequency in the output signal of the first diode, a component signal of the third frequency in the output signal of the third diode, and the output signal of the second diode.
Public/Granted literature
- US20220294542A1 METHOD AND DEVICE FOR MEASURING CHARACTERISTICS OF RF CHAINS Public/Granted day:2022-09-15
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