Invention Grant
- Patent Title: Method for analysis of yeast
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Application No.: US17806479Application Date: 2022-06-11
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Publication No.: US11643678B2Publication Date: 2023-05-09
- Inventor: Rui Chen , Haohan Xia
- Applicant: SHANGHAI RUIYU BIOTECH CO., LTD.
- Applicant Address: CN Shanghai
- Assignee: SHANGHAI RUIYU BIOTECH CO., LTD.
- Current Assignee: SHANGHAI RUIYU BIOTECH CO., LTD.
- Current Assignee Address: CN Shanghai
- Agency: Metis IP LLC
- Priority: CN 1911264590.8 2019.12.11
- Main IPC: C12Q1/06
- IPC: C12Q1/06 ; G06T7/62 ; G06T7/00

Abstract:
A method for analysis of yeast includes: receiving a microscopic image of yeast by a cloud server (2901), the microscopic image including a scaling pattern for determining a magnification; determining the magnification by the cloud server based on the scaling pattern (2902); and analyzing, by the cloud server, the microscopic image based on the magnification to obtain an analysis result (2903).
Public/Granted literature
- US20220372539A1 METHOD FOR ANALYSIS OF YEAST Public/Granted day:2022-11-24
Information query
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