Invention Grant
- Patent Title: Calibration standard for evanescence microscopy
-
Application No.: US17275409Application Date: 2019-09-12
-
Publication No.: US11644422B2Publication Date: 2023-05-09
- Inventor: Martin Oheim , Adi Salomon
- Applicant: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS) , UNIVERSITE DE PARIS , UNIVERSITE BAR-ILAN
- Applicant Address: FR Paris
- Assignee: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS),UNIVERSITE DE PARIS,UNIVERSITE BAR-ILAN
- Current Assignee: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS),UNIVERSITE DE PARIS,UNIVERSITE BAR-ILAN
- Current Assignee Address: FR Paris; FR Paris; IL Ramat Gan
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: EP 306193 2018.09.12
- International Application: PCT/EP2019/074431 2019.09.12
- International Announcement: WO2020/053367A 2020.03.19
- Date entered country: 2021-03-11
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G02B21/16
Abstract:
A calibration standard for determining an intensity decay related to an evanescent field generated close to the interface between a sample to be tested and a substrate on which the sample is to be deposited, preparation and analysis methods and use thereof.
Public/Granted literature
- US20220178828A1 CALIBRATION STANDARD FOR EVANESCENCE MICROSCOPY Public/Granted day:2022-06-09
Information query
