- Patent Title: X-ray fluoresence apparatus for a measurement of mineral slurries
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Application No.: US17268922Application Date: 2019-08-15
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Publication No.: US11644431B2Publication Date: 2023-05-09
- Inventor: Gregory John Roach
- Applicant: MICROTRACE PTY LIMITED
- Applicant Address: AU Bonnet Bay
- Assignee: Microtrace Pty Limited
- Current Assignee: Microtrace Pty Limited
- Current Assignee Address: AU Bonnet Bay
- Agency: Keller Preece PLLC
- Priority: AU 18903029 2018.08.17
- International Application: PCT/AU2019/050852 2019.08.15
- International Announcement: WO2020/034002A 2020.02.20
- Date entered country: 2021-02-16
- Main IPC: G01N23/223
- IPC: G01N23/223 ; G01N33/24

Abstract:
Disclosed is a measurement probe for a measurement of elements in a mineral slurry. The measurement probe includes a housing having an X-ray window. The housing encloses: an X ray source positioned to emit source X-rays at the X-ray window; an X-ray detector positioned to detect X-rays from the X-ray window; and a control module. The control module is configured to: control an operation of the X-ray source and the X-ray detector; process X-rays detected by the X-ray detector to generate X-ray spectra data; and process the X-ray spectra data to determine a quantity of one or more elements of interest in the mineral slurry. The measurement probe further includes a probe mount adapted to couple the measurement probe to a pipe mount on a pipe carrying the mineral slurry; when the probe mount is coupled to the pipe mount, the X-ray window provides a transmission window for X-rays into a lumen of the pipe.
Public/Granted literature
- US20210310969A1 APPARATUS FOR THE MEASUREMENT OF MINERAL SLURRIES Public/Granted day:2021-10-07
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