Invention Grant
- Patent Title: Ion through-substrate via
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Application No.: US17106473Application Date: 2020-11-30
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Publication No.: US11646247B2Publication Date: 2023-05-09
- Inventor: Yu-Yang Shen , Chien-Hsien Tseng , Dun-Nian Yaung , Nai-Wen Cheng , Pao-Tung Chen
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Eschweiler & Potashnik, LLC
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/522 ; H01L23/532 ; H01L21/265 ; H01L25/18

Abstract:
Various embodiments of the present disclosure are directed towards a semiconductor structure including a first through substrate via (TSV) within a substrate. The first TSV comprises a first doped region extending from a top surface of the substrate to a bottom surface of the substrate. A conductive via overlies the top surface of the substrate and is electrically coupled to the first TSV.
Public/Granted literature
- US20210082787A1 ION THROUGH-SUBSTRATE VIA Public/Granted day:2021-03-18
Information query
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