Invention Grant
- Patent Title: Method for fabricating semiconductor device with re-fill layer
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Application No.: US17497754Application Date: 2021-10-08
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Publication No.: US11646292B2Publication Date: 2023-05-09
- Inventor: Shing-Yih Shih
- Applicant: NANYA TECHNOLOGY CORPORATION
- Applicant Address: TW New Taipei
- Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee Address: TW New Taipei
- Agent Xuan Zhang
- Main IPC: H01L21/56
- IPC: H01L21/56 ; H01L23/00

Abstract:
A method for fabricating a semiconductor device includes providing a base wafer comprising a scribing portion; bonding a first stacked die and a second stacked die onto a front surface of the base wafer through a hybrid bonding process; conformally forming a re-fill layer to cover the first stacked die and the second stacked die; forming a first molding layer to cover the re-fill layer and configure an intermediate semiconductor device comprising the base wafer, the first stacked die, the second stacked die, the re-fill layer, and the first molding layer; and dicing the intermediate semiconductor device along the scribing portion to separate the first stacked die and the second stacked die, the re-fill layer, the first molding layer, and the base wafer.
Public/Granted literature
- US20230110531A1 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH RE-FILL LAYER Public/Granted day:2023-04-13
Information query
IPC分类: