A measurement system utilizing metasurfaces and compressive sensing is provided that measures specular and diffuse RF reflection properties of a sample omnidirectionally across a broad frequency regime in a monostatic, bistatic, or BRDF sense. The measurement system may be used to measure the full hemispherical (or spherical) reflection from a target that has been illuminated in a monostatic or bistatic case. The measurement system may also be used to measure the full BRDF of a sample or spatially complex bistatic reflections from a sample.