Invention Grant
- Patent Title: Method for manufacturing semiconductor structure with buried power line and buried signal line
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Application No.: US17524917Application Date: 2021-11-12
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Publication No.: US11647623B2Publication Date: 2023-05-09
- Inventor: Chiang-Lin Shih , Tseng-Fu Lu , Jeng-Ping Lin
- Applicant: NANYA TECHNOLOGY CORPORATION
- Applicant Address: TW New Taipei
- Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee Address: TW New Taipei
- Agent Xuan Zhang
- The original application number of the division: US17014282 2020.09.08
- Main IPC: H01L21/74
- IPC: H01L21/74 ; H01L23/535 ; H10B12/00

Abstract:
The present disclosure provides a method for manufacturing a semiconductor structure. The method includes providing a substrate having a first top surface; forming an isolation region in the substrate to surround an active region; forming a recess in the active region; disposing a first conductive material within the recess to form a buried power line and a buried signal line; forming a first circuit layer and a second circuit layer on the first top surface of the substrate, wherein the first circuit layer covers the buried power line and the buried signal line, and the second circuit layer is separated from the first circuit layer; and forming a cell capacitor over the first circuit layer.
Public/Granted literature
- US20220077148A1 METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE WITH BURIED POWER LINE AND BURIED SIGNAL LINE Public/Granted day:2022-03-10
Information query
IPC分类: