Invention Grant
- Patent Title: Failure diagnosis method and system of dual purge system
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Application No.: US17495033Application Date: 2021-10-06
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Publication No.: US11649788B2Publication Date: 2023-05-16
- Inventor: Young-Sun Nam , Hee-Nam Woo
- Applicant: Hyundai Motor Company , Kia Corporation
- Applicant Address: KR Seoul
- Assignee: Hyundai Motor Company,Kia Corporation
- Current Assignee: Hyundai Motor Company,Kia Corporation
- Current Assignee Address: KR Seoul; KR Seoul
- Agency: Morgan, Lewis & Bockius LLP
- Priority: KR 20210061913 2021.05.13
- Main IPC: F02M25/08
- IPC: F02M25/08

Abstract:
A failure diagnosis method and a failure diagnosis system of a dual purge system may determine whether a closed stuck failure or an opened stuck failure occurs in a line forming a dual purge system by measuring a pressure in a negative pressure formation device and comparing the corresponding pressure with a predetermined reference value when a purge valve of the dual purge system is in an opened or closed state, and may determine whether the failure occurs in components related to a secondary purge line in the dual purge system in which it is difficult to determine whether the failure occurs in a conventional failure diagnosis method of a single purge system in a simple method.
Public/Granted literature
- US20220364531A1 FAILURE DIAGNOSIS METHOD AND SYSTEM OF DUAL PURGE SYSTEM Public/Granted day:2022-11-17
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