Invention Grant
- Patent Title: Operator guided inspection device, system, and method
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Application No.: US17114979Application Date: 2020-12-08
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Publication No.: US11650165B2Publication Date: 2023-05-16
- Inventor: Thomas Alton Bartoshesky , Jonathan Douglas Williams , Robert Fuelep Biro
- Applicant: Thomas Alton Bartoshesky , Jonathan Douglas Williams , Robert Fuelep Biro
- Applicant Address: US MI Ann Arbor
- Assignee: Verify Technologies LLC
- Current Assignee: Verify Technologies LLC
- Current Assignee Address: US MI Ann Arbor
- Agency: Heed Law Group PLLC
- Agent Thomas P. Heed
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01N21/89

Abstract:
A device, system, and method related to operator guided inspection is disclosed. A portable inspection device (“PID”) is comprised of a housing, display, camera, light array, gyro, location sensor, a non-transitory computer-readable medium, a processor, and a computer-executable instruction set stored on the non-transitory computer-readable medium. The method is comprised of the steps of selecting an inspection task using the PID; capturing an image of the DUT; providing a reference image with reference dimensions; fixing the focal distance on the camera; providing a region of interest (“ROI”) and an alignment region (“AR”) on the display of the PID; adjusting the lighting of the PID to match the illumination on the DUT with the illumination in the reference image; adjusting the distance between the PID and the DUT such that the DUT fits in the ROI; rotating the PID until the ROI and AR merge into a Merged Region; calibrating the Merged Region with the reference image by scaling the pixel-level distances of the Merged Region with the reference dimensions of the reference image; and performing an automated inspection routine on one or more special characteristics of the DUT. The operator guided inspection system (“OGIS”) includes a plurality of PIDs capable of measuring a plurality of DUTs.
Public/Granted literature
- US20220178836A1 OPERATOR GUIDED INSPECTION DEVICE, SYSTEM, AND METHOD Public/Granted day:2022-06-09
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