Invention Grant
- Patent Title: Abnormal surface pattern detection for production line defect remediation
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Application No.: US17125754Application Date: 2020-12-17
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Publication No.: US11650167B2Publication Date: 2023-05-16
- Inventor: Yen Eng Fam , Jun Lee Kok , Bak Leng Lim , Yen Ling Lim
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Fremont
- Assignee: SEAGATE TECHNOLOGY LLC
- Current Assignee: SEAGATE TECHNOLOGY LLC
- Current Assignee Address: US CA Fremont
- Agency: Holzer Patel Drennan
- Main IPC: G01N21/956
- IPC: G01N21/956 ; G06T7/00 ; G01N21/88

Abstract:
A defect inspection system provides an image of a surface of a hard drive media to a machine learning model that is trained to identify predefined classifications of abnormal surface patterns on the hard drive media, each of the predefined classifications being associated in system memory with a severity indicator. The defect inspection model analyzes the image and generates and output indicating that the image includes a pattern consistent with a select classification of the predefined classifications of abnormal surface patterns. When the severity indicator for the select classification satisfies a failure condition, the defect inspection system automatically implements a corrective action.
Public/Granted literature
- US20220196571A1 ABNORMAL SURFACE PATTERN DETECTION FOR PRODUCTION LINE DEFECT REMEDIATION Public/Granted day:2022-06-23
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